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Gated Clock-Overview

Gated Clock-Overview

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Gated Clock - Overview

February 12, 2009

1.  Clock signal power consumption accounts for a large part of the system power consumption ( about 40% ) and accounts for more than 50% of dynamic power consumption

1.  DC gated clock command:
intert_clock_gating
set_clock_gating_style

1.  Gated clock insertion:
 

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1.  Use effect examples:

a.  For a 180nm chip technology: has clock gating and no clock gating results in comparison (chip Found):

a.  Power saving of 34% to 43% (more specific application mode)

a.  Area saving 20% (a clock gating can replace multiple mux )

1.  Principles of use:

a.  Registers with a bit width of 3 or more must use a gated clock

a.  The use of a gated clock for a single- bit register has no effect, and neither area nor power consumption will be saved.

a. Clock buffer尽可能多的放到clock gating cell的后面。

1. RTL具体措施:

a. 无用输出采用使能保持输出的方式编码:
NxtReadData = (ReadEn) ? RamData : 8'b0;  
如果没有读使能时,我们不关心输出什么数据的话,则改成:
NxtReadData = (ReadEn) ? RamData : ReadData;
这样就可以让ReadEn无效时把这8个寄存器的时钟关掉。

 

1. 3bit的计数器插clock gating前后电路对比
插门控之前:

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插门控之后:

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1. 不同bit数门控时钟插入对比

 

SMIC.18工艺

 

面积

 

动态功耗(W)

 

 

um2

门数

 

4bit暂存器

带ICG

221.72

25.25

1.185e-05

 

不带ICG

263.42

30

1.427e-05

3bit暂存器

带ICG

175.62

20

9.160e-06

 

不带ICG

197.57

22.5

9.920e-06

2bit暂存器

带ICG

131.71

15

6.315e-06

 

不带ICG

131.71

15

6.613e-06

1bit暂存器

带ICG

85.61

9.75

3.633e-06

 

不带ICG

65.86

7.5

3.307e-06

 

1. 门控时钟的结构:

 a. 结构-1

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This system clock gating mechanism is simple, but it is easy to make the clock after the gating incomplete and even produce glitches.

 

a.  Structure-2

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This gating method avoids the incompleteness of the gated clock and the generation of glitches, but the gated clock may generate a metastable state.

 

1.  Structure -3

This structure solves the metastable problem of Structure -2 .

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1.  Structure -4

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This structure with test mode can keep the clock on during the test.

 

1.  Structure -5

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When ASIC performs back-end testing, sometimes logic and registers in different clock domains may be connected for scan chain insertion. At this time, the clock source of a module may not pass its original clock path, but the entire chip The unified test clock needs to select the clock at this time.

 

 

 

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